Precision Measurements with the Total Reflection X-Ray Fluorescence System in Dar es Salaam

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dc.contributor.authorKoleleni, Yusuf I. A.
dc.contributor.authorKondoro, John W.
dc.date.accessioned2016-06-03T13:48:02Z
dc.date.available2016-06-03T13:48:02Z
dc.date.issued1999
dc.identifier.citationKoleleni, Y.I.A. and Kondoro, J.W.A., 1999. Precision measurements with the total reflection x-ray fluorescence system in Dar es Salaam. SINET: Ethiopian Journal of Science, 22(1), pp.141-146.en_US
dc.identifier.doi10.4314/sinet.v22i1.18139
dc.identifier.urihttp://hdl.handle.net/20.500.11810/2387
dc.language.isoenen_US
dc.titlePrecision Measurements with the Total Reflection X-Ray Fluorescence System in Dar es Salaamen_US
dc.typeJournal Article, Peer Revieweden_US
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