Browsing by Author "Ivanov, Zdravko"

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    Josephson Effects in Magnesium Diboride Based Josephson Junctions
    (2004-04) Malisa, Anayesu B.; Valkeapää, Markus; Johansson, Lars G.; Ivanov, Zdravko
    We report on Josephson effects in Josephson junctions fabricated from magnesium diboride (MgB2) thin films using a focused ion beam (FIB) milling technique. The films were deposited on SrTiO3(100) and {\mathrm {Al_2O_3}}(1\bar 102) substrates at room temperature using e-beam evaporation of MgB2 with a post-annealing stage in Mg vapour. Conventional photolithography and Ar-ion-beam milling were used to pattern the films into 4 and 8 µm wide microbridges. A focused ion beam was used to narrow the microbridges to 2 µm. The narrowed microbridges were thinned by making 50 nm wide cuts across them. The depth of each cut was calibrated to remove 75% of the film thickness. A thin MgB2 layer remained on the substrate after this process. The current–voltage (I–V) characteristics of junctions made using this technique show that the junctions carry excess current. The first Shapiro step was observed when one of the junctions was irradiated with a microwave field of frequency f = 8.92 GHz. The Shapiro step appeared at a voltage value V = hf/2e = 18.445 µV.
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    Josephson Junctions Fabricated by Focused Ion Beam from Ex Situ Grown MgB2 Thin Films
    (2004-03) Malisa, Anayesu B.; Valkeapää, M.; Johansson, L. -G; Ivanov, Zdravko
    We prepared MgB2 thin films on SrTiO3 (1 0 0) and Al2O3 (1 1̄ 0 2) substrates by e-beam evaporation of MgB2 pellet. The films were deposited at room temperature and post-annealed at 900 °C in Mg vapour for 5–30 min. Superconducting transition temperatures were observed between 22 and 30 K. Structure and surface morphology of the films were investigated by X-ray diffraction (XRD) and atomic force microscopy (AFM). The films grown on Al2O3 substrates are c-axis oriented while a film grown on SrTiO3 substrate is aligned with the (1 0 1) direction normal to the substrate planes. The films have grain sizes of about 70 nm. The films were patterned into 4 and 8 μm wide microbridges. The microbridges were observed to carry large critical current densities of approximately 1 MA/cm2 at 6.7 K. Focused ion beam (FIB) was used on the bridges in order to fabricate Josephson junctions. A cut 50 nm in width was made across the microbridges followed by an in situ platinum (Pt) deposition into the cut made. SNS-like weak-link junctions were formed in the process.