Correlation between optical, electrical and structural properties of vanadium dioxide thin films. J Mater Sci

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dc.contributor.authorMlyuka, N.R.
dc.contributor.authorKivaisi, R.T.
dc.date.accessioned2016-07-25T08:43:33Z
dc.date.available2016-07-25T08:43:33Z
dc.date.issued2006-09
dc.descriptionFull text can be accessed at http://link.springer.com/article/10.1007/s10853-006-0261-y#/page-1en_US
dc.description.abstractVO2 films have been prepared on normal microscope glass slides by reactive rf magnetron sputtering of vanadium target in a mixture of argon and oxygen. Optical properties of the films were investigated by the UV/Vis/NIR Perkin–Elmer Lamda 9. Transmission electron microscope and atomic force microscope were used to investigate the structure of the films. Correlation between structural and optical properties of VO2 thin films is investigated with respect to the dependence of both to substrate temperature.en_US
dc.identifier.citationMlyuka, N.R. and Kivaisi, R.T., 2006. Correlation between optical, electrical and structural properties of vanadium dioxide thin films. Journal of materials science, 41(17), pp.5619-5624.en_US
dc.identifier.doi10.1007/s10853-006-0261-y
dc.identifier.urihttp://hdl.handle.net/20.500.11810/3422
dc.language.isoenen_US
dc.titleCorrelation between optical, electrical and structural properties of vanadium dioxide thin films. J Mater Scien_US
dc.typeJournal Articleen_US
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