Correlation between optical, electrical and structural properties of vanadium dioxide thin films. J Mater Sci
Loading...
Date
2006-09
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Abstract
VO2 films have been prepared on normal microscope glass slides by reactive rf magnetron sputtering of vanadium target in a mixture of argon and oxygen. Optical properties of the films were investigated by the UV/Vis/NIR Perkin–Elmer Lamda 9. Transmission electron microscope and atomic force microscope were used to investigate the structure of the films. Correlation between structural and optical properties of VO2 thin films is investigated with respect to the dependence of both to substrate temperature.
Description
Full text can be accessed at
http://link.springer.com/article/10.1007/s10853-006-0261-y#/page-1
Keywords
Citation
Mlyuka, N.R. and Kivaisi, R.T., 2006. Correlation between optical, electrical and structural properties of vanadium dioxide thin films. Journal of materials science, 41(17), pp.5619-5624.